Stobert, E.: search on Z-Library

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1

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California (Monday 13 September 2010)] Photomask Technology 2010 - Substrate aware OPC rules for edge effect in block levels

Shao, Dongbing, Montgomery, M. Warren, Maurer, Wilhelm, Bailey, Todd C., Stobert, Ian, Popova, Irene, Chang, Chan Sam

Year:

2010

Language:

english

File:

PDF, 1.16 MB

english, 2010

2

[IEEE 2011 22nd Annual IEEE/SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2011.05.16-2011.05.18)] 2011 IEEE/SEMI Advanced Semiconductor Manufacturing Conference - Strategies for single patterning of contacts for 32nm and 28nm technology

Morgenfeld, Bradley, Stobert, Ian, Haffner, Henning, An, Juj, Kanai, Hideki, Ostermayr, Martin, Chen, Norman, Aminpur, Massud, Brodsky, Colin, Thomas, Alan

Year:

2011

Language:

english

File:

PDF, 1.68 MB

english, 2011

3

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California, United States (Tuesday 10 September 2013)] Photomask Technology 2013 - Your worst nightmare: inspection of aggressive OPC on 14nm masks with emphasis on defect sensitivity and wafer defect print predictability

Badger, Karen D., Hibbs, Michael, Rankin, Jed, Seki, Kazunori, Stobert, Ian, Dechene, Daniel J., Bleiman, Ben, Ghosal, Mini, Broadbent, William, Redding, Vincent, Faure, Thomas B., Ackmann, Paul W.

Year:

2013

Language:

english

File:

PDF, 1.53 MB

english, 2013

4

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 27 February 2011)] Optical Microlithography XXIV - Contact patterning strategies for 32nm and 28nm technology

Morgenfeld, Bradley, Stobert, Ian, An, Ju j, Kanai, Hideki, Chen, Norman, Aminpur, Massud, Brodsky, Colin, Thomas, Alan

Year:

2011

Language:

english

File:

PDF, 1.39 MB

english, 2011

5

The crossing number ofC5 �Cn

Kle??, Mari�n, Richter, R. Bruce, Stobert, Ian

Journal:

Journal of Graph Theory

Year:

1996

Language:

english

File:

PDF, 276 KB

english, 1996

6

Persuasive Cued Click-Points: Design, Implementation, and Evaluation of a Knowledge-Based Authentication Mechanism

Chiasson, S., Stobert, E., Forget, A., Biddle, R., Van Oorschot, P.C.

Journal:

IEEE Transactions on Dependable and Secure Computing

Year:

2012

Language:

english

File:

PDF, 913 KB

english, 2012

7

[IEEE 2012 IEEE Symposium on Visual Languages and Human-Centric Computing (VL/HCC) - Innsbruck, Austria (2012.09.30-2012.10.4)] 2012 IEEE Symposium on Visual Languages and Human-Centric Computing (VL/HCC) - Visual end-user security

Stobert, Elizabeth, Biddle, Robert

Year:

2012

Language:

english

File:

PDF, 1.36 MB

english, 2012

8

[ACM Press the Ninth Symposium - Newcastle, United Kingdom (2013.07.24-2013.07.26)] Proceedings of the Ninth Symposium on Usable Privacy and Security - SOUPS '13 - Memory retrieval and graphical passwords

Stobert, Elizabeth, Biddle, Robert

Year:

2013

Language:

english

File:

PDF, 1.18 MB

english, 2013

9

Outpatient versus inpatient uterine polyp treatment for abnormal uterine bleeding: randomised controlled non-inferiority study

Cooper, N. A. M., Clark, T. J., Middleton, L., Diwakar, L., Smith, P., Denny, E., Roberts, T., Stobert, L., Jowett, S., Daniels, J.

Journal:

Year:

2015

Language:

english

File:

PDF, 170 KB

english, 2015

10

[ACM Press the 2014 workshop - Victoria, British Columbia, Canada (2014.09.15-2014.09.18)] Proceedings of the 2014 workshop on New Security Paradigms Workshop - NSPW '14 - A Password Manager that Doesn't Remember Passwords

Stobert, Elizabeth, Biddle, Robert

Year:

2014

Language:

english

File:

PDF, 2.99 MB

english, 2014

11

[ACM Press the 28th of the international conference extended abstracts - Atlanta, Georgia, USA (2010.04.10-2010.04.15)] Proceedings of the 28th of the international conference extended abstracts on Human factors in computing systems - CHI EA '10 - Usability and strength in click-based graphical passwords

Stobert, Elizabeth

Year:

2010

Language:

english

File:

PDF, 874 KB

english, 2010

12

[ACM Press the 26th Annual Computer Security Applications Conference - Austin, Texas (2010.12.06-2010.12.10)] Proceedings of the 26th Annual Computer Security Applications Conference on - ACSAC '10 - Exploring usability effects of increasing security in click-based graphical passwords

Stobert, Elizabeth, Forget, Alain, Chiasson, Sonia, van Oorschot, P. C., Biddle, Robert

Year:

2010

Language:

english

File:

PDF, 666 KB

english, 2010

13

[ACM Press the extended abstracts of the 32nd annual ACM conference - Toronto, Ontario, Canada (2014.04.26-2014.05.01)] Proceedings of the extended abstracts of the 32nd annual ACM conference on Human factors in computing systems - CHI EA '14 - The agony of passwords

Stobert, Elizabeth

Year:

2014

Language:

english

File:

PDF, 956 KB

english, 2014

14

[ACM Press the 16th ACM conference - Chicago, Illinois, USA (2009.11.09-2009.11.13)] Proceedings of the 16th ACM conference on Computer and communications security - CCS '09 - Multiple password interference in text passwords and click-based graphical passwords

Chiasson, Sonia, Forget, Alain, Stobert, Elizabeth, van Oorschot, P. C., Biddle, Robert

Year:

2009

Language:

english

File:

PDF, 1.29 MB

english, 2009

15

SPIE Proceedings [SPIE SPIE Photomask Technology - Monterey, California, United States (Tuesday 29 September 2015)] Photomask Technology 2015 - New method of detection and classification of yield-impacting EUV mask defects

Hayashi, Naoya, Kasprowicz, Bryan S., Graur, Ioana, Vengertsev, Dmitry, Raghunathan, Ananthan, Stobert, Ian, Rankin, Jed

Year:

2015

Language:

english

File:

PDF, 626 KB

english, 2015

16

Femoroacetabular Impingement: A Retrospective Case Study With 8-Year Follow-Up

Stobert, Julia R., Emary, Peter C., Taylor, John A.

Journal:

Journal of Chiropractic Medicine (imprint: Elsevier)

Year:

2015

Language:

english

File:

PDF, 624 KB

english, 2015

17

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2013)] Advanced Etch Technology for Nanopatterning II - Etch correction, and OPC, a look at the current state and future of etch correction

Stobert, Ian, Dunn, Derren, Zhang, Ying, Oehrlein, Gottlieb S., Lin, Qinghuang

Year:

2013

Language:

english

File:

PDF, 535 KB

english, 2013

18

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 22 February 2009)] Optical Microlithography XXII - OPC simplification and mask cost reduction using regular design fabrics

Jhaveri, Tejas, Levinson, Harry J., Dusa, Mircea V., Stobert, Ian, Liebmann, Lars, Karakatsanis, Paul, Rovner, Vyacheslav, Strojwas, Andrzej, Pileggi, Larry

Year:

2009

Language:

english

File:

PDF, 363 KB

english, 2009

19

SPIE Proceedings [SPIE SPIE 31st International Symposium on Advanced Lithography - San Jose, CA (Sunday 19 February 2006)] Optical Microlithography XIX - Improvements in post-OPC data constraints for enhanced process corrections

Burns, Ryan L., Flagello, Donis G., Cui, Yuping, Zhao, Zengqin, Stobert, Ian, LaCour, Pat, Yehia, Ayman, Madkour, Kareem, Gheith, Mohamed, Seoud, Ahmed

Year:

2006

Language:

english

File:

PDF, 393 KB

english, 2006

20

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 22 February 2009)] Optical Microlithography XXII - Improving yield through the application of process window OPC

Tirapu Azpiroz, Jaione, Levinson, Harry J., Dusa, Mircea V., Krasnoperova, Azalia, Siddiqui, Shahab, Settlemyer, Kenneth, Graur, Ioana, Stobert, Ian, Oberschmidt, James M.

Year:

2009

Language:

english

File:

PDF, 427 KB

english, 2009

21

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 22 February 2009)] Optical Microlithography XXII - Etch aware optical proximity correction: a first step toward integrated pattern engineering

Dunn, D. N., Levinson, Harry J., Dusa, Mircea V., Mansfield, S., Stobert, I., Sarma, C., Lembach, G., Liu, J., Herold, K.

Year:

2009

Language:

english

File:

PDF, 213 KB

english, 2009

22

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California, USA (Sunday 24 February 2008)] Optical Microlithography XXI - The comparison of OPC performance and run time for dense versus sparse solutions

Abdo, Amr, Stobert, Ian, Viswanathan, Ramya, Burns, Ryan, Herold, Klaus, Kallingal, Chidam, Meiring, Jason, Oberschmidt, James, Mansfield, Scott

Year:

2008

Language:

english

File:

PDF, 584 KB

english, 2008

23

SPIE Proceedings [SPIE Photomask and Next-Generation Lithography Mask Technology XIV - Yokohama, Japan (Tuesday 17 April 2007)] Photomask and Next-Generation Lithography Mask Technology XIV - Impact of transmitted and reflected light inspection on mask inspectability, defect sensitivity, and mask design rule restrictions

Kodera, Yutaka, Badger, Karen, Gallagher, Emily, Akima, Shinji, Lawliss, Mark, Ikeda, Hidehiro, Stobert, Ian, Kikuchi, Yasutaka, Watanabe, Hidehiro

Year:

2007

Language:

english

File:

PDF, 240 KB

english, 2007

24

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Monday 6 October 2008)] Photomask Technology 2008 - Exploring new metrology for complex photomask patterns

Higuchi, Masaru, Kawahira, Hiroichi, Zurbrick, Larry S., Aihara, Tatsuya, Saito, Hideaki, Yonekura, Isao, Suzuki, Jotaro, Gallagher, Emily, Stobert, Ian P.

Year:

2008

Language:

english

File:

PDF, 1.29 MB

english, 2008

25

SPIE Proceedings [SPIE 26th Annual BACUS Symposium on Photomask Technology - Monterey, CA (Monday 18 September 2006)] Photomask Technology 2006 - Managing high-accuracy and fast convergence in OPC

Herold, Klaus, Martin, Patrick M., Naber, Robert J., Chen, Norman, Stobert, Ian P.

Year:

2006

Language:

english

File:

PDF, 442 KB

english, 2006

26

SPIE Proceedings [SPIE 27th Annual BACUS Symposium on Photomask Technology - Monterey, CA (Monday 17 September 2007)] Photomask Technology 2007 - Better on wafer performance and mask manufacturability of contacts with no or non-traditional serifs

Samuels, Donald, Naber, Robert J., Kawahira, Hiroichi, Stobert, Ian

Year:

2007

Language:

english

File:

PDF, 1.21 MB

english, 2007

27

SPIE Proceedings [SPIE 27th Annual BACUS Symposium on Photomask Technology - Monterey, CA (Monday 17 September 2007)] Photomask Technology 2007 - Exploring the sources of MEEF in contact SRAMs

Gallagher, Emily, Naber, Robert J., Kawahira, Hiroichi, Stobert, Ian, Higuchi, Masaru, Samuels, Donald

Year:

2007

Language:

english

File:

PDF, 666 KB

english, 2007

28

SPIE Proceedings [SPIE Photomask Technology - Monterey, CA (Monday 6 October 2008)] Photomask Technology 2008 - Optimizing models based OPC fragmentation using genetic algorithms

Dipaola, Domenico A., Kawahira, Hiroichi, Zurbrick, Larry S., Stobert, Ian

Year:

2008

Language:

english

File:

PDF, 954 KB

english, 2008

29

SPIE Proceedings [SPIE Advanced Lithography - San Jose, CA (Sunday 25 February 2007)] Metrology, Inspection, and Process Control for Microlithography XXI - Setting MRC rules: balancing inspection capabilities, defect sensitivity, and OPC

Stobert, Ian, Archie, Chas N., Bruce, James, Gheith, Mohamed, Seoud, Ahmed

Year:

2007

Language:

english

File:

PDF, 146 KB

english, 2007

30

SPIE Proceedings [SPIE 27th Annual BACUS Symposium on Photomask Technology - Monterey, CA (Monday 17 September 2007)] Photomask Technology 2007 - The effect of the OPC parameters on the performance of the OPC model

Abdo, Amr, Naber, Robert J., Kawahira, Hiroichi, Seoud, Ahmed, Wei, Alexander, Stobert, Ian, Leslie, Alan

Year:

2007

Language:

english

File:

PDF, 1.02 MB

english, 2007

31

SPIE Proceedings [SPIE SPIE Advanced Lithography - San Jose, California (Sunday 21 February 2010)] Optical Microlithography XXIII - Predicting and reducing substrate induced focus error

Liegl, Bernhard, Dusa, Mircea V., Conley, Will, Sapp, Brian, Low, Kia, Greco, Stephen, Brunner, Timothy, Felix, Nelson, Stobert, Ian, Nafisi, Kourosh, Sarma, Chandrasekhar

Year:

2010

Language:

english

File:

PDF, 4.29 MB

english, 2010

32

A patient-preference cohort study of office versus inpatient uterine polyp treatment for abnormal uterine bleeding

Cooper, Natalie A. M., Middleton, Lee, Smith, Paul, Denny, Elaine, Stobert, Lynda, Daniels, Jane, Clark, T. Justin

Journal:

Gynecological Surgery

Year:

2016

Language:

english

File:

PDF, 553 KB

english, 2016

33

OmniShare: Encrypted Cloud Storage for the Multi-Device Era

Paverd, Andrew, Tamrakar, Sandeep, Nguyen, Hoang Long, Pendyala, Praveen, Nguyen, Duc Thien, Stobert, Elizabeth, Grondahl, Tommi, Asokan, N., Sadeghi, Ahmad-Reza

Journal:

IEEE Internet Computing

Year:

2018

Language:

english

File:

PDF, 960 KB

english, 2018

34

The Password Life Cycle

Stobert, Elizabeth, Biddle, Robert

Journal:

ACM Transactions on Privacy and Security

Year:

2018

Language:

english

File:

PDF, 2.19 MB

english, 2018

35

OmniShare: Encrypted Cloud Storage for the Multi-Device Era

Paverd, Andrew, Tamrakar, Sandeep, Nguyen, Hoang Long, Pendyala, Praveen, Nguyen, Thien Duc, Stobert, Elizabeth, Grondahl, Tommi, Asokan, N., Sadeghi, Ahmad-Reza

Journal:

IEEE Internet Computing

Year:

2018

Language:

english

File:

PDF, 490 KB

english, 2018

36

Teaching Authentication as a Life Skill

Stobert, Elizabeth, Cavar, Elizabeta, Malisa, Luka, Sommer, David

Journal:

IEEE Security & Privacy Magazine

Year:

2018

Language:

english

File:

PDF, 1.87 MB

english, 2018

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